Репозиторий Dspace

Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)

Показать сокращенную информацию

dc.contributor.author Shlimas, D.I.
dc.contributor.author Kozlovskiy, A.L.
dc.contributor.author Kaliekperov, M.E.
dc.contributor.author Kadyrzhanov, K.K.
dc.contributor.author Uglov, V.V.
dc.date.accessioned 2023-12-04T10:58:45Z
dc.date.available 2023-12-04T10:58:45Z
dc.date.issued 2020
dc.identifier.other DOI: 10.29317/ejpfm.2020040305
dc.identifier.uri http://rep.enu.kz/handle/enu/10702
dc.description.abstract The paper presents the results of changes in the strength characteristics of thin-film coatings based on compounds of copper-bismuth, copper-magnesium, copper-nickel. The dependences of the influence of the phase composition on the strength characteristics, such as the coefficient of friction, bending strength and impact coefficient, are established. The effect of irradiation with helium ions with a high radiation dose of 10 15 -10 17 ion/cm 2 on the strength characteristics is evaluated. It is shown that an increase in the radiation dose leads to a decrease in strength properties due to the appearance of a large concentration of defects in the structure. ru
dc.language.iso en ru
dc.relation.ispartofseries Vol.4(3);234-241
dc.subject radiation resistant coatings ru
dc.subject thin films ru
dc.subject radiation defects ru
dc.subject strength ru
dc.subject resistance to external influences ru
dc.title Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni) ru
dc.type Article ru


Файлы в этом документе

Данный элемент включен в следующие коллекции

Показать сокращенную информацию

Поиск в DSpace


Просмотр

Моя учетная запись