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Raman Study of Polycrystalline Si3N4 Irradiated with Swift Heavy Ions

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dc.contributor.author Zhumazhanova, Ainash
dc.contributor.author Mutali, Alisher
dc.contributor.author Ibrayeva, Anel
dc.contributor.author Skuratov, Vladimir
dc.contributor.author Dauletbekova, Alma
dc.contributor.author Korneeva, Ekaterina
dc.contributor.author Akilbekov, Abdirash
dc.contributor.author Zdorovets, Maxim
dc.date.accessioned 2024-09-17T06:43:40Z
dc.date.available 2024-09-17T06:43:40Z
dc.date.issued 2021
dc.identifier.citation Zhumazhanova, A.; Mutali, A.; Ibrayeva, A.; Skuratov, V.; Dauletbekova, A.; Korneeva, E.; Akilbekov, A.; Zdorovets, M. Raman Study of Polycrystalline Si3N4 Irradiated with Swift Heavy Ions. Crystals 2021, 11, 1313. https:// doi.org/10.3390/cryst11111313 ru
dc.identifier.issn 2073-4352
dc.identifier.other doi.org/10.3390/cryst11111313
dc.identifier.uri http://rep.enu.kz/handle/enu/16455
dc.description.abstract A depth-resolved Raman spectroscopy technique was used to study the residual stress profiles in polycrystalline silicon nitride that was irradiated with Xe (167 MeV, 1 × 1011 cm−2 ÷ 4.87 × 1013 cm−2 ) and Bi (710 MeV, 1 × 1011 cm−2 ÷ 1 × 1013 cm−2 ) ions. It was shown that both the compressive and tensile stress fields were formed in the irradiated specimen, separated by a buffer zone that was located at a depth that coincided with the thickness of layer, amorphized due to multiple overlapping track regions. The compressive stresses were registered in a subsurface region, while at a greater depth, the tensile stresses were recorded and their levels reached the maximum value at the end of ion range. The size of the amorphous layer was evaluated from the dose dependence of the full width at half maximum (FWHM) (FWHM of the dominant 204 cm−1 line in the Raman spectra and scanning electron microscopy ru
dc.language.iso en ru
dc.publisher Crystals ru
dc.relation.ispartofseries Volume 11;Issue 11
dc.subject silicon nitride ru
dc.subject swift heavy ions ru
dc.subject Raman spectra ru
dc.subject mechanical stresses ru
dc.subject piezospectroscopy ru
dc.title Raman Study of Polycrystalline Si3N4 Irradiated with Swift Heavy Ions ru
dc.type Article ru


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