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Variation in the Bandgap of Amorphous Zinc Tin Oxide: Investigating the Thickness Dependence via In Situ STS

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dc.contributor.author Callaghan, Peter J.
dc.contributor.author Caffrey, David
dc.contributor.author Zhussupbekov, Kuanysh
dc.contributor.author Berman, Samuel
dc.contributor.author Zhussupbekova, Ainur
dc.contributor.author Smith, Christopher M.
dc.contributor.author Shvets, Igor V.
dc.date.accessioned 2024-09-18T04:55:46Z
dc.date.available 2024-09-18T04:55:46Z
dc.date.issued 2024
dc.identifier.issn 2470-1343
dc.identifier.other doi.org/10.1021/acsomega.3c09958
dc.identifier.uri http://rep.enu.kz/handle/enu/16552
dc.description.abstract Amorphous transparent conducting oxides (aTCOs) have seen substantial interest in recent years due to the significant benefits that they can bring to transparent electronic devices. One such material of promise is amorphous ZnxSn1−xOy (a-ZTO). a-ZTO possesses many attractive properties for a TCO such as high transparency in the visible range, tunable charge carrier concentration, electron mobility, and only being composed of common and abundant elements. In this work, we employ a combination of UV−vis spectrophotometry, X-ray photoemission spectroscopy, and in situ scanning tunneling spectroscopy to investigate a 0.33 eV blue shift in the optical bandgap of a-ZTO, which we conclude to be due to quantum confinement effects. ru
dc.language.iso en ru
dc.publisher ACS Omega ru
dc.relation.ispartofseries Vol 9;Issue 6
dc.title Variation in the Bandgap of Amorphous Zinc Tin Oxide: Investigating the Thickness Dependence via In Situ STS ru
dc.type Article ru


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